Semrock 荧光滤光片组 LF405/488/532/635-4X-A

描述:This "Pinkel" multiband set is optimized for laser excitation over four bands - utilizing a 375 or 405 nm laser source for DAPI, a 473 or 488 nm laser source for GFP or FITC, a 532 nm laser source for TRITC, and a 632.8, 635, or 647.1 nm laser source for Cy5. This set provides high brightness, extremely low crosstalk, and superb signal-to-noise ratio.

Our improved version is certified to deliver dichroic flatness <= 1λ P-V RWE @ 632.8 nm for loose and cube mounted [NTE, OFF, OMF or ZHE] filter sets LF405/488/532/635-4X-B

适用荧光探针:Laser-optimized 6-filter "Pinkel" quad-band set with 4 exciters and quad-band emitter and beamsplitter filters. Ideal for use with: Blue: DAPI; Green: FITC , GFP ; Orange: mRFP1, mCherry; Red: Cy5
Semrock网站链接:LF405/488/532/635-4X-A
配置 是否装配激发块 *未税美元价格
LF405/488/532/635-4X-A-000 false $2575.0000
LF405/488/532/635-4X-A-L01 false $2575.0000
LF405/488/532/635-4X-A-S01 false 2725.0000
LF405/488/532/635-4X-A-NQF true 2974.0000
LF405/488/532/635-4X-A-NTE true 2974.0000
LF405/488/532/635-4X-A-OMF true 3024.0000
LF405/488/532/635-4X-A-OFF true 3024.0000
LF405/488/532/635-4X-A-ZHE true 2864.0000
LF405/488/532/635-4X-A-LDMK true 2934.0000
LF405/488/532/635-4X-A-LDMP true 3024.0000

* 说明:
1.
价格为未包含增值税,关税及运费美元价格。
2. false表示未装配激发块, True表示含激发块
3. -000:标准尺寸,-L01:Leica大尺寸组,-S01:带sutter螺纹环,-zero:零像素漂移滤光片组
4. -NQF, -NTE:Nikon激发块;-OMF, -OFF:Olympus激发块;-ZHE:Zeiss激发块;-LDMK, -LDMP:Leica激发块。

滤光片组成

功能 型号
Single Band Exciter FF01-390/40-25
Single Band Exciter FF02-482/18-25
Single Band Exciter FF01-532/3-25
Single Band Exciter FF01-640/14-25
Quad Band Emitter FF01-446/510/581/703-25
Quad Band Dichroic Di01-R405/488/532/635-25x36

通用规格

参数
背景截止度 BrightLine filters have blocking far exceeding OD 6 as needed to ensure a black background, even when using modern low-noise CCD cameras. The blocking is optimized for microscopy applications using our exclusive SpecMaker™ fluorescence filter design.
显微镜兼容性 BrightLine filters are available to fit Leica, Nikon, Olympus, Zeiss, and Aperio microscopes.
光学损伤阈值 Testing has proven to show no signs of degradation when exposed to at least 6.0 W of power from an unfiltered xenon arc lamp over a 25 mm diameter (corresponding to 1.2 W/cm2) for over 500 hours.
Scratch-Dig 60-40