Semrock 荧光滤光片组 LF405/488/532/635-B
| 描述：This full-multiband set is optimized for laser excitation over four bands - utilizing a 375 or 405 nm laser source for DAPI, a 473 or 488 nm laser source for GFP or FITC, a 532 nm laser source for TRITC, and a 632.8, 635, or 647.1 nm laser source for Cy5. This set provides high brightness, extremely low crosstalk, and superb signal-to-noise ratio. The dichroic offers industry-leading 1λ P-V RWE for minimal focus shift and aberrations of the laser beam spot up to 10 mm diameter to enable popular imaging and Super-Resolution techniques including TIRF, PALM, STORM, and Structured-Illumination.
Loose and cube mounted filter sets are certified to deliver dichroic flatness <= 1λ P-V RWE @ 632.8 nm.
Looking for this filter set in one of the following cubes: NQF, LDMK or LDMP? |
| 适用荧光探针：1λ P-V RWE super-resolution laser optimized multiband set with quad-band exciter, emitter, and beamsplitter filters. Ideal for use with: Blue: DAPI; Green: FITC , GFP ; Orange: TRITC; Red: Cy5 |
| Semrock网站链接：LF405/488/532/635-B |
| 配置 | 是否装配激发块 | *未税美元价格 |
| LF405/488/532/635-B-000 | false | $1730.0000 |
| LF405/488/532/635-B-NTE | true | $2129.0000 |
| LF405/488/532/635-B-OMF | true | 2179.0000 |
| LF405/488/532/635-B-OFF | true | 2179.0000 |
| LF405/488/532/635-B-ZHE | true | 2019.0000 |
* 说明：
1. 价格为未包含增值税，关税及运费美元价格。
2. false表示未装配激发块， True表示含激发块
3. -000：标准尺寸，-L01：Leica大尺寸组，-S01：带sutter螺纹环，-zero：零像素漂移滤光片组
4. -NQF, -NTE：Nikon激发块；-OMF, -OFF：Olympus激发块；-ZHE：Zeiss激发块；-LDMK, -LDMP：Leica激发块。
滤光片组成
| 功能 | 型号 |
| Quad Band Exciter | FF01-390/482/532/640-25 |
| Quad Band Emitter | FF01-446/510/581/703-25 |
| Quad Band Dichroic | Di03-R405/488/532/635-t1-25x36 |
通用规格
| 参数 | 值 |
| 背景截止度 | BrightLine filters have blocking far exceeding OD 6 as needed to ensure a black background, even when using modern low-noise CCD cameras. The blocking is optimized for microscopy applications using our exclusive SpecMaker™ fluorescence filter design. |
| 显微镜兼容性 | BrightLine filters are available to fit Leica, Nikon, Olympus, Zeiss, and Aperio microscopes. |
| 光学损伤阈值 | Testing has proven to show no signs of degradation when exposed to at least 6.0 W of power from an unfiltered xenon arc lamp over a 25 mm diameter (corresponding to 1.2 W/cm2) for over 500 hours. |
| Scratch-Dig | 60-40 |