Semrock 滤光片 Di01-R488/543/635-25x36
488/543/635 nm lasers BrightLine® triple-edge laser dichroic beamsplitter
Optimized beamsplitters for the most popular lasers used in fluorescence imaging, including newer all-solid-state lasers for conventional laser based microscopy such as confocal imaging. All beamsplitters in this category have exceptional reflectance at the laser wavelengths, and anti-reflection (AR) coatings to minimize imaging artifacts resulting from the coherent laser light. This dichroic beamsplitter is optimized for reflecting laser beams up to 2.5 mm in diameter while minimizing RWE. **Limited quantities of Di01-R488/543/635 parts remain available. Final availability and delivery will be confirmed upon receipt of order** |
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曲线ASC II 参数：measured 类型：Transmission 下载Di01-R488/543/635-25x36数据： TXT Spectrum data Semrock网站链接：Di01-R488/543/635-25x36 |
| 型号 | 尺寸 | *未税价格 |
| Di01-R488/543/635-25x36 | 25.2 mm x 35.6 mm x 1.1 mm | $600.00 |
* 说明：价格为未包含增值税，关税及运费之价格。
通用规格
| 参数 | 值 |
| size | 25.2 mm x 35.6 mm x 1.1 mm |
| shape | rectangular |
| mounted | false |
| substrate.thickness | 1.05 mm |
| substrate.type | low-autofluorescence optical quality glass |
| scratch-dig | 60-40 |
BrightLineLaserReflDi.Tripleband系列参数
| 参数 | 值 |
| Tolerance | Shift of 0.35%/degree (40 – 50 degrees) |
| rabs-and-passband-range.1 | Rabs > 94% 471 – 491 nm |
| absrefl-avgppol.1 | Rabs > 90% 471 – 491 nm |
| absrefl-avgspol.1 | Rabs > 98% 471 – 491 nm |
| edgewl.1 | 499 nm |
| tavg-and-passband-range.1 | Tavg > 93% 503.5 – 526.5 nm |
| rabs-and-passband-range.2 | Rabs > 94% 541.5 – 544.5 nm |
| rabs-and-passband-range.2(p-pol) | Rabs > 90% 541.5 – 544.5 nm |
| rabs-and-passband-range.2(s-pol) | Rabs > 98% 541.5 – 544.5 nm |
| edgewl.2 | 553 nm |
| tavg-and-passband-range.2 | Tavg > 93% 560 – 615.5 nm |
| rabs-and-passband-range.3 | Rabs > 94% 632.8 – 647.1 nm |
| rabs-and-passband-range.3(p-pol) | Rabs > 90% 632.8 – 647.1 nm |
| rabs-and-passband-range.3(s-pol) | Rabs > 98% 632.8 – 647.1 nm |
| edgewl.3 | 658 nm |
| tavg-and-passband-range.3 | Tavg > 93% 665.5 – 800 nm |
| aoi | 45 degrees with a shift of 0.35%/degree (40 – 50 degrees) |
| cha | 0.5 degrees |
| Optical.Damage.Rating | 2 J/cm2 at 532 nm (for a 532nm filter) |
| Steepness | Steep |
| Transverse.Dimensions.(LxW) | 25.2 mm x 35.6 mm |
| Transverse.Tolerance.(mounted) | ± 0.1 mm |
| Filter.Thickness.(unmounted) | 1.05 mm |
| Filter.Thickness.Tolerance.(unmounted) | ± 0.05 mm |
| Clear.Aperture | ≥ 80% (elliptical) |
| Substrate.Type | Fused Silica |
| Orientation | Reflective surface marked with part number - Orient in direction of incoming light |
| Effective.Index | 1.86 Understanding ‘Effective Index of Refraction’ neff |
| laserwls.1 | 473 +/- 2 nm, 488 +3/-2 nm |
| laserwls.2 | 543.5 nm |
| laserwls.3 | 632.8 nm, 635 +7/-0 nm, 647.1 nm |
| Flatness.RWE | Laser |
| RWE.1 | < 6λ P-V RWE @ 632.8 nm |