Semrock 荧光滤光片组 QDLP-C
| 描述：A special long-pass emission filter in this filter set allows simultaneous viewing by eye or with a color camera of samples that are multi-labeled with quantum dot nanocrystals. It takes advantage of the unique fact that all quantum dots share a common UV/blue excitation spectrum while simultaneously exhibiting narrow and specific visible emission spectra. The highly transmitting, deep-blue exciter efficiently excites all quantum dots with no UV light to damage samples or generate undesirable background, while the high and uniform transmission of the long-pass emission filter provides exceptional and balanced brightness. And with the "no burn-out" performance shared by all BrightLine filters, the permanent performance of this set will outlast even your quantum dots! |
| 适用荧光探针：High brightness and contrast long-pass filter set. Ideal for use with: Qdot 525, Qdot 565, Qdot 585, Qdot 605, Qdot 625, Qdot 655, Qdot 705, Qdot 800 Nanocrystals |
| 配置 |
是否装配激发块 |
*未税美元价格 |
| QDLP-C-000 |
false |
$930.0000 |
| QDLP-C-L01 |
false |
$930.0000 |
| QDLP-C-U02 |
false |
1674.0000 |
| QDLP-C-NQF |
true |
1329.0000 |
| QDLP-C-NTE |
true |
1329.0000 |
| QDLP-C-OMF |
true |
1379.0000 |
| QDLP-C-OFF |
true |
1379.0000 |
| QDLP-C-OFX |
true |
1629.0000 |
| QDLP-C-ZHE |
true |
1219.0000 |
| QDLP-C-LDMK |
true |
1289.0000 |
| QDLP-C-LDMP |
true |
1379.0000 |
* 说明：
1. 价格为未包含增值税，关税及运费美元价格。
2. false表示未装配激发块， True表示含激发块
3. -000：标准尺寸，-L01：Leica大尺寸组，-S01：带sutter螺纹环，-zero：零像素漂移滤光片组
4. -NQF, -NTE：Nikon激发块；-OMF, -OFF：Olympus激发块；-ZHE：Zeiss激发块；-LDMK, -LDMP：Leica激发块。
滤光片组成
| 功能 |
型号 |
| Single Band Exciter |
FF02-435/40-25 |
| Long Pass Emitter |
FF01-500/LP-25 |
| Single Band Dichroic |
FF510-Di02-25x36 |
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通用规格
| 参数 |
值 |
| 背景截止度 |
BrightLine filters have blocking far exceeding OD 6 as needed to ensure a black background, even when using modern low-noise CCD cameras. The blocking is optimized for microscopy applications using our exclusive SpecMaker™ fluorescence filter design. |
| 显微镜兼容性 |
BrightLine filters are available to fit Leica, Nikon, Olympus, Zeiss, and Aperio microscopes. |
| 光学损伤阈值 |
Testing has proven to show no signs of degradation when exposed to at least 6.0 W of power from an unfiltered xenon arc lamp over a 25 mm diameter (corresponding to 1.2 W/cm2) for over 500 hours. |
| Scratch-Dig |
60-40 |
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