Semrock 滤光片 Di03-R660-t3-25x36
660 nm laser BrightLine® single-edge super-resolution / TIRF dichroic beamsplitter
| The perfect dichroic beamsplitters for the most popular lasers used in fluorescence imaging, including all-solid-state lasers for advanced microscopy. All beamsplitters in this category have exceptional reflectance at the key laser wavelengths, and wider reflection bands — into UV for photoactivation and super-resolution techniques. Additionally they feature extended transmission regions — into IR to 1200 or 1600 nm, and anti-reflection (AR) coatings to minimize imaging artifacts resulting from the coherent laser light.
Semrock's super-resolution / TIRF dichroics are available in two thicknesses and deliver industry-leading flatness for minimal focus shift and optical wavefront aberrations of the laser beam spot to enable popular imaging and Super-resolution techniques such as TIRF, PALM, STORM, Structured Illumination, and STED.
1λ P-V RWE on 1 mm, optimized for reflecting laser beams up to 10 mm in diameter while minimizing RWE **Limited quantities of Di03-R660-t3 parts remain available. Final availability and delivery will be confirmed upon receipt of order** |
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曲线ASC II 参数：measured 类型：Transmission 下载Di03-R660-t3-25x36数据： TXT Spectrum data Semrock网站链接：Di03-R660-t3-25x36 |
| 型号 | 尺寸 | *未税价格 |
| Di03-R660-t3-25x36 | 25.2 mm x 35.6 mm x 3.0 mm | 报价联系我们 |
* 说明：价格为未包含增值税，关税及运费之价格。
通用规格
| 参数 | 值 |
| size | 25.2 mm x 35.6 mm x 3.0 mm |
| shape | rectangular |
| mounted | false |
| substrate.type | low-autofluorescence optical quality glass |
| scratch-dig | 60-40 |
BrightLineLaserReflDi.Singleband系列参数
| 参数 | 值 |
| rabs-and-passband-range.1 | Rabs > 94% 647.1 – 665.0 nm |
| rabs-and-passband-range.1(p-pol) | Rabs > 90% 647.1 – 665.0 nm |
| rabs-and-passband-range.1(s-pol) | Rabs > 98% 647.1 – 665.0 nm |
| tavg-and-passband-range.1 | Tavg > 93% 677.0 – 1200 nm |
| laserwls.1 | 647.1 nm, 658.0 nm, 660 ± 5 nm |
| aoi | 45 degrees with a shift of 0.35%/degree (40 – 50 degrees) |
| cha | 0.5 degrees |
| Optical.Damage.Rating | Not Tested |
| Effective.Index | 1.79 Understanding ‘Effective Index of Refraction’ neff |
| Transverse.Dimensions.(LxW) | 25.2 mm x 35.6 mm |
| Transverse.Tolerance.(mounted) | ± 0.1 mm |
| Filter.Thickness.1.(unmounted) | 1.05 mm |
| Filter.Thickness.Tolerance.1.(unmounted) | ± 0.05 mm |
| Filter.Thickness.3.(unmounted) | 3.0 mm |
| Filter.Thickness.Tolerance.3.(unmounted) | ± 0.1 mm |
| Clear.Aperture | ≥ 80% (elliptical) |
| Substrate Thickness (1 mm, unmounted) | 1.05 mm |
| Substrate Thickness Tolerance (1 mm, unmounted) | ± 0.05 mm |
| Substrate Thickness (3 mm, unmounted) | 3.0 mm |
| Flatness.RWE | Super-resolution / TIRF |
| RWE.1 | < 1λ P-V RWE @ 632.8 nm |
| RWE.3 | < 0.2λ P-V RWE @ 632.8 nm |