Semrock 滤光片 FF538-FDi02-t3-25x36
538 nm edge BrightLine® single-edge image-splitting dichroic beamsplitter for super-resolution microscopy
| BrightLine® image-splitting dichroic beamsplitters offer superb image quality for both transmitted and reflected light when separating beams of light by color for simultaneous capture of multi-color images. For applications such as (FRET) and real-time live-cell imaging, users can now separate two, four or even more colors onto as many cameras or regions of a single camera sensor. The exceptional flatness of these filters virtually eliminates aberrations in the reflected beam for most common imaging systems.
Semrock's image-splitting dichroics for super-resolution microscopy deliver industry-leading λ/5 P-V RWE on 3 mm thick substrates for minimal focus shift and optical wavefront aberrations of the reflected imaging beam. These dichroics can be used with much larger diameter imaging beams up to 37 mm while minimizing RWE in custom size versions. Common Fluorophore Pair to Split: GFP/mOrange FF538-FDi01 image-splitting dichroic beamsplitter for standard micrscopy available on 1 mm substrate for reflecting imaging beams up to 10 mm in diameter while minimizing RWE |
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曲线ASC II 参数：measured 类型：Transmission 下载FF538-FDi02-t3-25x36数据： TXT Spectrum data Semrock网站链接：FF538-FDi02-t3-25x36 |
| 型号 | 尺寸 | *未税价格 |
| FF538-FDi02-t3-25x36 | 25.2 mm x 35.6 mm x 3.0 mm | $600.00 |
* 说明：价格为未包含增值税，关税及运费之价格。
通用规格
| 参数 | 值 |
| size | 25.2 mm x 35.6 mm x 3.0 mm |
| shape | rectangular |
| mounted | false |
| substrate.type | low-autofluorescence optical quality glass |
| scratch-dig | 60-40 |
BrightLineDichroic.Singleband系列参数
| 参数 | 值 |
| ravg-and-passband-range.1 | Ravg > 95% 350 – 528.4 nm |
| edgewl.1 | 538 nm |
| tavg-and-passband-range.1 | Tavg > 93% 547.7 – 1200 nm |
| Fluorophore-pair-to-split | GFP/mOrange |
| aoi | 45 ± 1.5 degrees |
| cha | 2 degrees |
| Optical.Damage.Rating | Testing has proven to show no signs of degradation when exposed to at least 6.0 W of power from an unfiltered xenon arc lamp over a 25 mm diameter (corresponding to 1.2 W/cm2) for over 500 hrs. |
| Steepness | Standard |
| Effective.Index | 1.96 Understanding ‘Effective Index of Refraction’ neff |
| Transverse.Dimensions.(LxW) | 25.2 mm x 35.6 mm |
| Transverse.Tolerance.(mounted) | ± 0.1 mm |
| Filter.Thickness.3.(unmounted) | 3.0 mm |
| Filter.Thickness.Tolerance.3.(unmounted) | ± 0.1 mm |
| Clear.Aperture | ≥ 80% (elliptical) |
| Substrate Thickness (3 mm, unmounted) | 3.0 mm |
| Orientation | Reflective surface marked with laser dot - Orient in direction of incoming light |
| Flatness.RWE | Image-splitting |
| RWE.3 | < 0.2λ P-V RWE @ 632.8 nm |