Semrock 滤光片 FF560-FDi01-25x36

560 nm edge BrightLine® single-edge image-splitting dichroic beamsplitter for standard microscopy

BrightLine® image-splitting dichroic beamsplitters offer superb image quality for both transmitted and reflected light when separating beams of light by color for simultaneous capture of multi-color images. For applications such as (FRET) and real-time live-cell imaging, users can now separate two, four or even more colors onto as many cameras or regions of a single camera sensor. The exceptional flatness of these filters virtually eliminates aberrations in the reflected beam for most common imaging systems. This dichroic beamsplitter is optimized for reflecting imaging beams up to 10 mm in diameter while minimizing RWE.

Common Fluorophore Pair to Split: YFP/dTomato

Interested in an improved Flatness / RWE version? Consider Semrock's image-splitting dichoric beamsplitter for super-resolution microscopy:
λ/5 P-V RWE on 3mm FF560-FDi02-t3, optimized for reflecting imaging beams up to 37 mm in custom size versions.

曲线ASC II 参数:measured
类型:Transmission
下载FF560-FDi01-25x36数据: TXT Spectrum data
Semrock网站链接:FF560-FDi01-25x36
型号 尺寸 *未税价格
FF560-FDi01-25x36 25.2 mm x 35.6 mm x 1.1 mm $370.00

* 说明:价格为未包含增值税,关税及运费之价格。

通用规格

参数
size 25.2 mm x 35.6 mm x 1.1 mm
shape rectangular
mounted false
substrate.thickness 1.05 mm
substrate.type low-autofluorescence optical quality glass
scratch-dig 60-40

BrightLineDichroic.Singleband系列参数

参数
ravg-and-passband-range.1 Ravg > 95% 350 – 550 nm
edgewl.1 560 nm
tavg-and-passband-range.1 Tavg > 93% 570.1 – 950 nm
aoi 45 ± 1.5 degrees
cha 2 degrees
Optical.Damage.Rating Testing has proven to show no signs of degradation when exposed to at least 6.0 W of power from an unfiltered xenon arc lamp over a 25 mm diameter (corresponding to 1.2 W/cm2) for over 500 hrs.
Steepness Standard
Transverse.Dimensions.(LxW) 25.2 mm x 35.6 mm
Transverse.Tolerance.(mounted) ± 0.1 mm
Filter.Thickness.(unmounted) 1.05 mm
Filter.Thickness.Tolerance.(unmounted) ± 0.05 mm
Clear.Aperture ≥ 80% (elliptical)
Orientation Reflective surface marked with part number - Orient in direction of incoming light
Effective.Index 1.77 Understanding ‘Effective Index of Refraction’ neff
Fluorophore-pair-to-split YFP/dTomato
Flatness.RWE Image-splitting
RWE.1 < 2λ P-V RWE @ 632.8 nm