Semrock 滤光片 FF720-SDi01-25x36
720 nm edge BrightLine® multiphoton short-pass dichroic beamsplitter
Semrock offers a wide range of dichroic beamsplitters optimized for pulsed lasers used in multiphoton applications. These multiphoton dichroics have low GDD that helps minimize temporal pulse broadening of reflected laser beams while exhibiting steep edges with very high and flat reflection and transmission bands.
These are ideal solutions for femtosecond pulsed lasers such as Ti:Sapphire (& OPO coupled), neodymium- and ytterbium-doped fiber and glass lasers, enabling deep tissue imaging with improved contrast. |
曲线ASC II 参数:measured 类型:Transmission 下载FF720-SDi01-25x36数据: TXT Spectrum data Semrock网站链接:FF720-SDi01-25x36 |
型号 | 尺寸 | *未税价格 |
FF720-SDi01-25x36 | 25.2 mm x 35.6 mm x 1.1 mm | $600.00 |
* 说明:价格为未包含增值税,关税及运费之价格。
通用规格
参数 | 值 |
size | 25.2 mm x 35.6 mm x 1.1 mm |
shape | rectangular |
mounted | false |
substrate.thickness | 1.05 mm |
substrate.type | low-autofluorescence optical quality glass |
scratch-dig | 60-40 |
MultiphotonSHGDichroic系列参数
参数 | 值 |
ravg-and-passband-range.1 | Ravg > 95% 750 – 875 nm |
absrefl-avgppol.1 | Rabs > 99% 800 – 820 nm |
absrefl-avgspol.1 | Rabs > 99% 800 – 820 nm |
edgewl.1 | 720 nm |
tavg-and-passband-range.1 | Tavg > 85% 370 – 690 nm |
wavelength-range(p-pol) | Tabs > 90% 400 – 410 nm |
wavelength-range(s-pol) | Tabs > 90% 400 – 410 nm |
aoi | 45 ± 1.5 degrees |
cha | 2 degrees |
Optical.Damage.Rating | Testing has proven to show no signs of degradation when exposed to at least 6.0 W of power from an unfiltered xenon arc lamp over a 25 mm diameter (corresponding to 1.2 W/cm2) for over 500 hrs. |
Steepness | Standard |
Transverse.Dimensions.(LxW) | 25.2 mm x 35.6 mm |
Transverse.Tolerance.(mounted) | ± 0.1 mm |
Filter.Thickness.(unmounted) | 1.05 mm |
Filter.Thickness.Tolerance.(unmounted) | ± 0.05 mm |
Clear.Aperture | ≥ 80% (elliptical) |
Orientation | Reflective surface marked with part number - Orient in direction of incoming light |
Effective.Index | 1.99 Understanding ‘Effective Index of Refraction’ neff |
Flatness.RWE | Standard Epi-fluorescence |
RWE.1 | >> 6λ P-V RWE @ 632.8 nm |