Semrock 滤光片 FF738-FDi01-t1-25x36
738 nm edge BrightLine® single-edge image-splitting dichroic beamsplitter for standard microscopy
| BrightLine® image-splitting dichroic beamsplitters offer superb image quality for both transmitted and reflected light when separating beams of light by color for simultaneous capture of multi-color images. For applications such as (FRET) and real-time live-cell imaging, users can now separate two, four or even more colors onto as many cameras or regions of a single camera sensor. The exceptional flatness of these filters virtually eliminates aberrations in the reflected beam for most common imaging systems. This dichroic beamsplitter is optimized for reflecting imaging beams up to 10 mm in diameter while minimizing RWE.
Common Fluorophore Pair to Split: Cy5.5/Cy7
Interested in an improved Flatness / RWE version? |
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曲线ASC II 参数：measured 类型：Transmission 下载FF738-FDi01-t1-25x36数据： TXT Spectrum data Semrock网站链接：FF738-FDi01-t1-25x36 |
| 型号 | 尺寸 | *未税价格 |
| FF738-FDi01-t1-25x36 | 25.2 mm x 35.6 mm x 1.1 mm | $456.00 |
* 说明：价格为未包含增值税，关税及运费之价格。
通用规格
| 参数 | 值 |
| size | 25.2 mm x 35.6 mm x 1.1 mm |
| shape | rectangular |
| mounted | false |
| substrate.type | low-autofluorescence optical quality glass |
| scratch-dig | 60-40 |
BrightLineDichroic.Singleband系列参数
| 参数 | 值 |
| ravg-and-passband-range.1 | Ravg > 95% 400 – 722 nm |
| edgewl.1 | 738 nm |
| tavg-and-passband-range.1 | Tavg > 93% 754 – 1200 nm |
| Fluorophore-pair-to-split | Cy5.5/Cy7 |
| aoi | 45 ± 1.5 degrees |
| cha | 2 degrees |
| Optical.Damage.Rating | Testing has proven to show no signs of degradation when exposed to at least 6.0 W of power from an unfiltered xenon arc lamp over a 25 mm diameter (corresponding to 1.2 W/cm2) for over 500 hrs. |
| Steepness | Standard |
| Effective.Index | 1.81 Understanding ‘Effective Index of Refraction’ neff |
| Transverse.Dimensions.(LxW) | 25.2 mm x 35.6 mm |
| Transverse.Tolerance.(mounted) | ± 0.1 mm |
| Filter.Thickness.3.(unmounted) | 3.0 mm |
| Filter.Thickness.Tolerance.3.(unmounted) | ± 0.1 mm |
| Clear.Aperture | ≥ 80% (elliptical) |
| Substrate Thickness (3 mm, unmounted) | 3.0 mm |
| Orientation | Reflective surface marked with part number - Orient in direction of incoming light |
| Flatness.RWE | Image-splitting |
| RWE.3 | < 0.2λ P-V RWE @ 632.8 nm |