Semrock 滤光片 FF980-Di01-t1-25x36

980 nm BrightLine® Multiphoton LaserMUX™ Beam Combiner

Multiphoton LaserMUX™ beam combiners enable deeper tissue imaging and improved contrast in multi-color and multi-modal fluorescence microscopy. The filters set new performance standards by simultaneously achieving high transmission, high reflection, and low GDD over both reflection & transmission, while maintaining minimal wavefront distortion. Ideal for combining two femtosecond pulsed laser beams, they are perfect for optogenetics and other life science applications.

Combine two or more femtosecond pulsed lasers such as Ti:Sapphire (& OPO coupled), neodymium and ytterbium-doped fiber and glass lasers, and Cr-forsterite lasers.

< 1λ P-V RWE on 1 mm, optimized for reflecting laser beams up to 10 mm in diameter while minimizing RWE
< λ/10 P-V Transmitted Wavefront Error
< ± 100 fs² Group Delay Dispersion over popular femtosecond laser wavelengths

曲线ASC II 参数:measured
类型:Transmission
下载FF980-Di01-t1-25x36数据: TXT Spectrum data
Semrock网站链接:FF980-Di01-t1-25x36
型号 尺寸 *未税价格
FF980-Di01-t1-25x36 25.2 mm x 35.6 mm x 1.1 mm $750.00

* 说明:价格为未包含增值税,关税及运费之价格。

通用规格

参数
size 25.2 mm x 35.6 mm x 1.1 mm
shape rectangular
mounted false
substrate.type low-autofluorescence optical quality glass
scratch-dig 60-40

BrightLineDichroic.Singleband系列参数

参数
rabs-and-passband-range.1 Ravg > 95% 770 – 938 nm over any 10 nm window
rabs-and-passband-range.1(p-pol) Ravg > 90% 770 – 930 nm
rabs-and-passband-range.1(s-pol) Ravg > 98% 770 – 968 nm
tavg-and-passband-range.1 Tavg > 93% 1022 – 2100 nm over any 10 nm window
wavelength-range(p-pol) Tavg > 95% 992 – 2100 nm
wavelength-range(s-pol) Tavg > 90% 1022 – 2100 nm
aoi 45 ± 1.5 degrees
cha 1.5 degrees
Optical.Damage.Rating 50 mJ/cm² @ 800 nm (50 fs pulse width); test pending; specification based on FS01 Mirror test results
Flatness.1 1λ P-V RWE @ 632.8 nm
TWE λ/10 PV over CA @ 632.8 nm
Effective.Index 1.77 Understanding ‘Effective Index of Refraction’ neff
GDD-Reflection(p-pol) ± 100 fs² over 771 - 911 nm
± 500 fs² over 757 - 933 nm
GDD-Reflection(s-pol) ± 100 fs² over 753 - 949 nm
± 500 fs² over 751 - 970 nm
GDD-Transmisson(p-pol) ± 100 fs² over 1020 - 2050 nm (excluding substrate, by design)
± 500 fs² over 1000 - 2100 nm (excluding substrate, by design)
GDD-Transmisson(s-pol) ± 100 fs² over 1065 - 2050 nm (excluding substrate, by design)
± 500 fs² over 1038 - 2100 nm (excluding substrate, by design)
Transverse.Dimensions.(LxW) 25.2 mm x 35.6 mm
Transverse.Tolerance.(mounted) ± 0.1 mm
Filter.Thickness.1.(unmounted) 1.05 mm
Filter.Thickness.Tolerance.1.(unmounted) ± 0.05 mm
Clear.Aperture ≥ 85% (elliptical)
Substrate Thickness (1 mm, unmounted) 1.05 mm
Substrate Thickness Tolerance (1 mm, unmounted) ± 0.05 mm
Flatness.RWE Super-resolution / TIRF
RWE.1 < 1λ P-V RWE @ 632.8 nm